Boulder, Colorado - April 16, 2018:

PSim Enables Oak Ridge Scientists To Explore Microstructures in Thin-Film Block Copolymer Nanocomposites

Tech-X Corporation is pleased to announce the publication of research results by PSim users in the ACS Macromolecules article, "Interpreting Neutron Reflectivity Profiles of Diblock Copolymer Nanocomposite Thin Films Using Hybrid Particle-Field Simulations" by Jyoti P Mahalik, Jason W Dugger, Scott W Sides, Bobby G Sumpter, Valeria Lauter, and Rajeev Kumar.

PSim is used to simulate thin-films of copolymer nanocomposites containing spherical magnetite nanoparticles covered by a polystyrene corona. The results in PSim are used to model and extract quantitative information about the structure of these thin-films and helps researchers interpret neutron reflectivity profiles.

PSim's flexible setup capabilities, enabled by advanced object-oriented design, allowed researchers to simulate the
specific copolymer/nanoparticle composites in the study and study how the inclusion of spherical nanoparticles modifies the microstructure of the copolymer thin-films.

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